Reliability Physics and Engineering: Time-To-Failure Modeling
De (autor): J. W. Mcpherson
Provides comprehensive textbook on reliability physics of semiconductors, from fundamentals to applications
Explains the fundamentals of reliability physics and engineering tools for building better products
Contains statistical training and tools within the text
Includes new chapters on Physics of Degradation, and Resonance and Resonance-Induced Degradation.
-10%
transport gratuit
PRP: 1115.91 Lei
Acesta este Pretul Recomandat de Producator. Pretul de vanzare al produsului este afisat mai jos.
1004.32Lei
1004.32Lei
1115.91 LeiPrimesti 1004 puncte
Primesti puncte de fidelitate dupa fiecare comanda! 100 puncte de fidelitate reprezinta 1 leu. Foloseste-le la viitoarele achizitii!
Livrare in 2-4 saptamani
Pentru a putea comanda rapid este nevoie sa introduceti numarul dvs de telefon in formatul 0xxxxxxxxx (10 cifre).Un operator Libris.ro va suna si va cere telefonic restul datelor necesare.
Descrierea produsului
Provides comprehensive textbook on reliability physics of semiconductors, from fundamentals to applications
Explains the fundamentals of reliability physics and engineering tools for building better products
Contains statistical training and tools within the text
Includes new chapters on Physics of Degradation, and Resonance and Resonance-Induced Degradation.
Detaliile produsului
De pe acelasi raft
Parerea ta e inspiratie pentru comunitatea Libris!